Statistical–Physical Microphysics Parameterization Schemes: A Proposed Framework for Physically Based Microphysics Schemes That Learn from Observations
Marcus van Lier-Walqui, Columbia Univ. and NASA GISS, New York, NY; and H. Morrison, M. R. Kumjian, K. J. Reimel, O. P. Prat, S. Lunderman, and M. Morzfeld