To support these claims, the team has made several initial laboratory investigations. The measurement system was comprised of two types of RF-amplifiers with operating frequency at S-band, were selected for this experiment, an InGaP-based HBT and a GaAs-based FET. It was shown experimentally that amplifier performance in terms of output power and efficiency improved at lower temperatures. This is consistent with a higher transistor gain associated with a larger electron mobility at a lower active region lattice temperature. A synthesized RF-generator (HP, model 8671B) provided a 2.0 to 18.0 GHz RF signal with adjustable power to the input of the amplifiers via a flexible UTiFLEX microwave cable assembly (Micro-Coax) and a variety of measurements were recorded. For example, HEMTs are more sensitive to temperature level, the selected HEMT device showed a 26% improvement in linear and 10% in saturated output power region when its base plate was cooled from +65 degrees C to +5 degrees C. Future work will develop a new efficient packaging technique to integrate Peltier-cooler modules with RF-power transistors using existing low cost devices.
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