Bayesian estimation of ice sticking efficiencies using profiling radar Doppler spectra and in situ measurements of ice properties
Marcus van Lier-Walqui, Columbia Univ. and NASA GISS, New York, NY; and A. M. Fridlind, A. S. Ackerman, C. R. Williams, G. McFarquhar, W. Wu, X. Dong, J. Wang, A. V. Korolev, X. Li, W. K. Tao, and D. Wu