The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-R: Measurements, Calibration, Validation, and Data Products

Francis G. Eparvier, University of Colorado, Boulder, CO; and T. N. Woods, A. R. Jones, M. Snow, D. L. Woodraska, E. M. B. Thiemann, W. E. McClintock, M. Anfinson, R. A. Viereck, J. L. Machol, M. Todirita, G. J. Comeyne, and S. K. Tadikonda

© 2017, AMS
97th American Meteorological Society Annual Meeting