Abstract Details

The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-R: Measurements, Calibration, Validation, and Data Products

Francis G. Eparvier, University of Colorado, Boulder, CO; and T. N. Woods, A. R. Jones, M. Snow, D. L. Woodraska, E. M. B. Thiemann, W. E. McClintock, M. Anfinson, R. A. Viereck, J. L. Machol, M. Todirita, G. J. Comeyne, and S. K. Tadikonda