The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-R: Measurements, Calibration, Validation, and Data Products
Francis G. Eparvier, University of Colorado, Boulder, CO; and T. N. Woods, A. R. Jones, M. Snow, D. L. Woodraska, E. M. B. Thiemann, W. E. McClintock, M. Anfinson, R. A. Viereck, J. L. Machol, M. Todirita, G. J. Comeyne, and S. K. Tadikonda