Constraining and Estimating Microphysical Parameterization Uncertainty using Polarimetric Radar Observations and the Bayesian Observationally-constrained Statistical-physical Scheme (BOSS), a Novel Probabilistic Microphysics Framework
Marcus van Lier-Walqui, Columbia Univ. and NASA GISS, New York, NY; and M. R. Kumjian, C. Martinkus, H. Morrison, and O. P. Prat