5th GOES Users' Conference


Overview of GOES-R Analysis Facility for Instrument Impacts on Requirements (GRAFIIR) Planned Activities and Recent Progress

Allen Huang, CIMSS/Univ. of Wisconsin, Madison, WI; and M. Goldberg

GRAFIIR is a facility established to leverage existing capabilities and those under development for both current GOES and its successor in data processing and product evaluation to support GOES-R analysis of instruments impacts on meeting user and product requirements. GRAFIIR is for “connecting the dots”, the components that have been built and/or are under development, to provide a flexible frame work to effectively adopt component algorithms toward analyzing the sensor measurements with different elements of sensor characteristic (i.e. noise, navigation, band to band co-registration, diffraction, etc.) and its impact on products. GRAFIIR is also built to assess and evaluate many of the GOES-R data and products (i.e. imagery, clouds, derived products, soundings, winds, etc.) in a consistent way to ensure the instrument effects on the products can be fully accounted for, characterized and product performance could be optimized.

In the users' conference we will report this coordinated team effort about its planned activities and recent progress.

Poster Session 1, Fifth GOES Users' Confererence Poster Session
Wednesday, 23 January 2008, 2:30 PM-4:00 PM, Exhibit Hall B

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