5th GOES Users' Conference


GOES-N EUVS observations during post-launch testing

Douglas J. Strickland, Computational Physics, Inc., Springfield, VA; and J. S. Evans, W. K. Woo, D. R. McMullin, S. P. Plunkett, and R. Viereck

We report initial observations by the Extreme Ultraviolet Sensor (EUVS) that is the first of four such sensors to be flown on the N-P series of GOES. The Post-Launch Test (PLT) period began in July 2006 and ended in early January 2007 during which continuous observations were made from August through November. Data will be reported from EUVS's five spectral channels designated by the letters A-E whose reporting intervals from the EUVS Calibration and Data Handbook are 5-15, 25-34, 42-63, 17-81, and 118-127 nm, respectively. The dominant contributors to Channels B and E are HeII 30.4 nm and HI 121.6 nm, respectively. Comparisons for selected months from the PLT period will be made with TIMED/SEE data for all channels and with SOHO/SEM data for Channel B. EUVS observations of the X-class flare that occurred on December 5 will also be reported, including flare to pre-flare irradiance ratios from channel to channel.

All EUVS data being reported have been processed by us using the newly developed calibration algorithm presented in the companion paper. The algorithm software enables us to examine changes to calibration factors caused by pointing offsets and to changes in spectral behavior over the spectral range of a given channel. An assessment of the PLT EUVS data being presented will be given in light of sensitivity studies that have addressed these effects

Poster Session 1, Fifth GOES Users' Confererence Poster Session
Wednesday, 23 January 2008, 2:30 PM-4:00 PM, Exhibit Hall B

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