Wednesday, 23 January 2008
ABI system overview
Exhibit Hall B (Ernest N. Morial Convention Center)
The Advanced Baseline Imager (ABI) will deliver a significant increase in data quality and quantity over the current Imager. This paper will discuss the instrument's design, operation, and ground processing. Details will be provided on the optical architecture, angular sample distances, scan scenarios for collecting Full Disk, CONUS, and mesoscale images, and the ground processing to convert downlinked detector samples (Level 0) to calibrated, geo-located pixel images (Level 1B).
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