New Methodology for ATMS Noise Characterization
This research first conducts a series of comparisons of the performances of NEDT and Allan Deviation applied on a few different datasets, which include several artificially constructed noisy data that can represent stable, quickly and slowly fluctuated measurements, respectively. The Allan Deviation given in this comparison includes two forms: the so-called overlapping Allan Deviation and two-sample Allan Deviation, and each form coming with two variances. The results are discussed and recommendations are provided based on the analysis. Overall, the Allan Deviation serves better for sensitivity characterization for all the tested cases. Further, stability of the overlapping Allan Deviation is studied by altering the size of data and the Allan interval (e.g., the averaging factor in some literature). In each case, the overlapping Allan Deviation quickly converges as either the size or the Allan interval increases. In the end, both NEDT and Allan Deviation are compared by using the real ATMS measurements, ground and on-orbit.