1.3 The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-R: Measurements, Calibration, Validation, and Data Products

Monday, 23 January 2017: 11:30 AM
620 (Washington State Convention Center )
Francis G. Eparvier, University of Colorado, Boulder, CO; and T. N. Woods, A. R. Jones, M. Snow, D. L. Woodraska, E. M. B. Thiemann, W. E. McClintock, M. Anfinson, R. A. Viereck, J. L. Machol, M. Todirita, G. J. Comeyne, and S. K. Tadikonda

The GOES-R series of NOAA satellites carry the EXIS suite that consists of all new versions of the Extreme Ultraviolet Sensors (EUVS) and X-Ray Sensors (XRS) for monitoring the solar irradiance in the wavelength range that drives the thermosphere and ionosphere. The previous version of the EUVS measured broad bandpasses, whereas the new EUVS measures specific solar line emissions selected to span the range of temperatures and variability in the solar atmosphere, allowing for the modeling of the full spectral range. The new XRS features updated technology, an increased dynamic range, and flare location capability, while continuing the longstanding historical record of solar soft X-ray measurements of flare variability. In this presentation we will describe the measurements made by the GOES-R EXIS, the calibration and validation program for the instrument, and the planned data products.
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