Prediction of Winter Wheat High Yield from Remote Sensing–Based Model: Application in the United States and Ukraine

Accurate and timely crop yield forecasts are critical for making informed agricultural policies and investments, as well as increasing market efficiency and stability. In Becker-Reshef et al. (2010) and Franch et al. (2015) we developed an empirical generalized model for forecasting winter wheat yield. It is based on the relationship between the Normalized Difference Vegetation Index (NDVI) at the peak of the growing season and the Growing Degree Day (GDD) information extracted from NCEP/NCAR reanalysis data. These methods were applied to MODIS CMG data in Ukraine, the US and China with errors around 10%. However, the NDVI is saturated for yield values higher than 4 MT/ha. As a consequence, the model had to be re-calibrated in each country and the validation of the national yields showed low correlation coefficients. In this study we present a new model based on the extrapolation of the pure wheat signal (100% of wheat within the pixel) from MODIS data at 1km resolution and using the Difference Vegetation Index (DVI). The model has been applied to monitor the national yield of winter wheat in the United States and Ukraine from 2001 to 2016.