Session 3B Measurement and Modeling of Atmospheric Ammonia—Part II

Monday, 8 January 2018: 10:30 AM-12:00 PM
Room 18CD (ACC) (Austin, Texas)
Host: 20th Conference on Atmospheric Chemistry
Cochairs:
Jeff Collett, Colorado State Univ., Fort Collins, MD and Xiaohong Liu, Univ. of Wyoming, Atmospheric Science, Laramie, WY

Ammonia is a key ingredient in many of today's air quality challenges.  It is an important contributor to fine particle formation and to excess nitrogen deposition.  Because it is not a regulated pollutant, its atmospheric concentrations, sources, and sinks are not as well known as for many other air pollutants.  This session seeks to highlight ongoing research efforts that add to our knowledge of atmospheric ammonia, its sources, and its environmental impacts.  Topics of interest include efforts to characterize ammonia sources, new efforts to measure ammonia concentrations in the ambient atmosphere, studies of ammonia contributions to fine particle and haze formation, and contributions of ammonia to nitrogen deposition.  Both observational (in situ and remote sensing) and model-based investigations are welcome.

Papers:
10:30 AM
3B.1
10:45 AM
3B.2
Atmospheric NH3 Dynamics in Relation to PM2.5 Pollution in the North China Plain (Invited Presentation)
Xuejun Liu, China Agricultural Univ., Beijing, Beijing, China; and W. Xu, Y. Zhang, and A. Tang

11:00 AM
3B.3
The Underappreciated Role of Nonvolatile Cations on Aerosol Ammonium–Sulfate Molar Ratios
Rodney Weber, Georgia Institute of Technology, Atlanta, GA; and H. Guo and A. Nenes
11:15 AM
3B.4
Increased Atmospheric Ammonia over the World’s Major Agricultural Areas Detected from Space
J. X. Warner, Univ. of Maryland, College Park, MD; and Z. Wei, R. R. Dickerson, L. L. Strow, Y. Wang, and Q. Liang
11:45 AM
3B.6
Initial Applications of the New Cross-Track Infrared Sounder (CrIS) Satellite Observations of Ammonia
Mark W. Shephard, Environment Canada, Toronto, Canada; and S. K. Kharol, C. McLinden, C. E. Sioris, K. Cady-Pereira, E. Dammers, J. J. Siemons, L. Zhang, C. Whaley, J. Zhang, A. Segers, M. Schaap, J. M. O'Brien, P. A. Makar, and R. Vet
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